- G1KM-1110 Electrical Characterization of Semiconductor Materials 1, 13
- G1KM-1120 Impedance Measurements on Semiconductor Materials and Devices 1,2,13
- G1KM-1130 Precision Impedance and Phase Measurements via Lock-in Amplifiers 1,3,13
- G1KM-1210 Low Frequency Noise Measurements on Semiconductor Devices 1,4,13
- G1KM-1220 High Frequency Noise Measurements on Semiconductor Devices 1,5,13
- G1KM-1310 On-wafer S-parameter Measurements 6,13
- G1KM-1410 Sampling Oscilloscope Measurements 7,13
- G1KM-1420 Real Time Oscilloscope Measurements 8,13
- G1KM-2110 2 and 3 Dimensional Surface Measurements with Optical Profilometer 9,13
- G1KM-2120 Powder X-Ray Diffraction Measurements 10,13
- G1KM-2130 Spectroscopic Ellipsometry Measurements of Thin Films 10,13
- G1KM-3110 Thermal Probe Lithography 11,13
- G1KM-4110 Wire and Ribbon Bonding 12,13
- G1KM-9900 Custom Measurements and Experiments 13
- On-Wafer/Fixture I-V, C-V measurements
- Up to 120 MHz.
- Up to 600 MHz.
- Up to 40 MHz.
- Up to 50 GHz.
- Up to 110 GHz.
- 100 GHz Bandwidth
- 63 GHz Bandwidth
- Confocal, interferometry, Active Illumination Focus Variation, Spectroscopic Reflectometry
- To be offered in the second half of 2021
- Sub-micron patterning/lithography with Thermal Scanning Probe Lithography System
- 18-25 micrometer Gold and Aluminum Wire, Gold Ribbon
- Price will be determined according to technical requirements.
Equipment / Measure Standart / Reference Material Sales And Automation Set Up Service List